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Issue DateTitle / Author(s) / CitationFileAltmetrics
2007-07

Jeong, Hoesam; Yoo, Byoung-Joo; Han, Cheolkyu; Lee, Sang-Yoon; Lee, Kang-Yoon; Kim, Suhwan; Jeong, Deog-Kyoon; Kim, Wonchan

IEEE Journal of Solid State Circuits, vol. 42, no. 6, pp. 1318-1327

DOI
1