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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2005-06 | Perit Dial Int. 2005 May-Jun;25(3):248-55. | view filelink | |
2017 | RSC Advances, Vol.7 No.21, pp.12541-12549 | view fileDOI | |
2022-06 | STEM Image Analysis Based on Deep Learning: Identification of Vacancy Defects and Polymorphs of MoS2 Nano Letters, Vol.22 No.12, pp.4677-4685 | DOI |
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