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Issue DateTitle / Author(s) / CitationFileAltmetrics
2005-02

Park, J; Kang, E; Son, SU; Park, HM; Lee, MK; Kim, J; Kim, KW; Noh, HJ; Park, JH; Bae, CJ; Park, JG; Hyeon, T

Advanced Materials, Vol.17 No.4, pp.429-434

DOI
1