Publications

Detailed Information

A new objective method of measuring fabric wrinkles using a 3-D projecting grid technique

DC Field Value Language
dc.contributor.authorKANG, TAE JIN-
dc.contributor.authorCHO, DAE HWAN-
dc.contributor.authorWHANG, HYUN SUK-
dc.date.accessioned2009-11-11T04:56:27Z-
dc.date.available2009-11-11T04:56:27Z-
dc.date.issued1999-04-
dc.identifier.citationTextile Res. J. 69(4), 261-268en
dc.identifier.issn0040-5175-
dc.identifier.urihttps://hdl.handle.net/10371/11892-
dc.description.abstractA new objective method for evaluating fabric wrinkles involves a 3-D projecting grid technique based on image processing. The uniform grid is projected on the AATCC replica surface, and then the gridded image of each replica is captured by the image capturing system. Noise reduction and extraction of the horizontal features of the image by enhancement and horizontal filters follow, and finally the projected grid phase is analyzed. The 3-D shape of the wrinkling of each replica is reconstructed with the data calculated from the deformation of grid lines obtained from the image capturing system. Based on the reconstructed 3-D information of each replicate, the degree of wrinkling is quantified using parameters that describe the quantity of fabric wrinkling: roughness ratio, surface area ratio, wrinkle density, and power spectrum density of the fast Fourier transform. Results indicate that the grades of AATCC wrinkle recovery replicas show a good logarithmic relationship with the parameters defined in this study. The precise and reliable wrinkle grades of four colored and complicated fabric patterns are obtained by using the wrinkle grading equation through multiple regression of four parameters.en
dc.language.isoen-
dc.publisherSAGE Publicationsen
dc.subjectCrease Recoveryen
dc.subjectGarmenten
dc.subjectImage Analysisen
dc.subjectMeasuring Systemen
dc.titleA new objective method of measuring fabric wrinkles using a 3-D projecting grid techniqueen
dc.typeArticleen
dc.contributor.AlternativeAuthor강태진-
dc.contributor.AlternativeAuthor조대환-
dc.contributor.AlternativeAuthor황현석-
dc.identifier.doi10.1177/004051759906900405-
Appears in Collections:
Files in This Item:
There are no files associated with this item.

Altmetrics

Item View & Download Count

  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Share