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Microscopic investigation of resistive switching in TiO₂thin film using conductive atomic force microscopy

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Authors
신용철
Advisor
황철성
Issue Date
2008
Publisher
서울대학교 대학원
Keywords
TiO₂TiO₂ReRAMReRAM저항변화메모리resistive switching필라멘트CAFMCAFMfilament
Description
Thesis(masters) --서울대학교 대학원 :재료공학부,2008.2.
Language
English
URI
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041115

http://hdl.handle.net/10371/14998
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Material Science and Engineering (재료공학부) Theses (Master's Degree_재료공학부)
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