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Texton 기법을 응용한 Semi-conductor wafer SEM 영상의 불량검출
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- Authors
- Advisor
- 유석인
- Issue Date
- 2009
- Publisher
- 서울대학교 대학원
- Keywords
- 웨이퍼 ; Wafer ; SEM ; SEM ; 불량 검출 ; detect detection ; Texton ; Texton ; PCA ; PCA ; 이미지 코딩 ; Image Coding
- Description
- 학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부,2009.8.
- Language
- Korean
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000038757
https://hdl.handle.net/10371/44663
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