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Temporal noise analysis and reduction method in CMOS image sensor readout circuit : CMOS image sensor readout 회로의 temporal 잡음 분석과 감소 방법
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- Authors
- Advisor
- 신형철
- Issue Date
- 2009
- Publisher
- 서울대학교 대학원
- Keywords
- CMOS image sensor readout 회로 ; CMOS image sensor readout circuit ; Correlated double sampling ; Correlated double sampling ; 저주파 잡음 (1/f 잡음과 RTN) ; Low frequency noise(1/f noise and RTN) ; 잡음 감소 ; Noise reduction ; 잡음 전달 함수 ; Noise transfer function ; 열 잡음 ; Thermal noise
- Description
- Thesis(masters) --서울대학교 대학원 :전기. 컴퓨터공학부, 2009.2.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000037008
https://hdl.handle.net/10371/44879
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