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Effects of strain and defects on ferroelectricity in oxide perovskite thin films : 응력과 결함이 산화물 페로브스카이트 박막의 강유전성에 미치는 효과
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- Authors
- Advisor
- 노태원
- Issue Date
- 2008
- Publisher
- 서울대학교 대학원
- Keywords
- 강유전 초박막 ; ferroelectric thin film ; 임계두께 ; critical thickness ; 분극소거장 ; depolarization field ; 분극감쇠 ; polarization decay ; 응력 ; strain ; 결함 쌍극자 ; defect dipole ; 유도 강유전성 ; induced ferroelectricity.
- Description
- Thesis(doctors)--서울대학교 대학원 :물리학부,2008.2.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000039367
https://hdl.handle.net/10371/46367
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