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High-frequency noise modeling of nanoscale MOSFETs : 나노스케일 MOSFET의 고주파 잡음 모델링
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- Authors
- Advisor
- 신형철
- Issue Date
- 2009
- Publisher
- 서울대학교 대학원
- Keywords
- 나노 스케일 MOSFET ; RF CMOS ; 채널 열 잡음 ; nanoscale MOSFETs ; 산탄 잡음 ; the channel thermal noise ; 잡음 파라미터 ; shot noise ; 짧은 채널 효과 ; noise parameters ; short channel effects
- Description
- Thesis(doctors) --서울대학교 대학원 :전기· 컴퓨터공학부,2009.8.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000038200
https://hdl.handle.net/10371/46835
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