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C-V 방법을 이용한 저온 다결정 실리콘 박막 트랜지스터의 신뢰성 분석
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- Authors
- Advisor
- 한민구
- Issue Date
- 2003
- Publisher
- 서울대학교 대학원
- Keywords
- poly-Si ; Poly-si ; TFT ; Tft ; C-V ; C-v ; Hot Carrier Stress ; Hot carrier stress ; 결함(trap) ; Tap ; 결정입계 (grain boundary) ; Grain boundary
- Description
- 학위논문(석사)--서울대학교 대학원 :전기·컴퓨터공학부,2003.
- Language
- Korean
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000059986
https://hdl.handle.net/10371/48353
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