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1f noise modeling including oxide trap distribution
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- Authors
- Advisor
- 박영준
- Issue Date
- 2006
- Publisher
- 서울대학교 대학원
- Keywords
- 잡음 ; 1 ; f noise ; noise ; impedance field method ; number fluctuation ; mobility fluctuation ; noise measurement ; noise simulation ; MOSFET
- Description
- Thesis(master`s)--서울대학교 대학원 :전기. 컴퓨터공학부,2006.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047701
https://hdl.handle.net/10371/53038
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