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1f noise modeling including oxide trap distribution

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dc.contributor.advisor박영준-
dc.contributor.author이종환-
dc.date.accessioned2010-02-09T05:46:32Z-
dc.date.available2010-02-09T05:46:32Z-
dc.date.copyright2006.-
dc.date.issued2006-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047701eng
dc.identifier.urihttps://hdl.handle.net/10371/53038-
dc.descriptionThesis(master`s)--서울대학교 대학원 :전기. 컴퓨터공학부,2006.en
dc.format.extent47 leavesen
dc.language.isoenen
dc.publisher서울대학교 대학원en
dc.subject잡음en
dc.subject1en
dc.subjectf noiseen
dc.subjectnoiseen
dc.subjectimpedance field methoden
dc.subjectnumber fluctuationen
dc.subjectmobility fluctuationen
dc.subjectnoise measurementen
dc.subjectnoise simulationen
dc.subjectMOSFETen
dc.title1f noise modeling including oxide trap distributionen
dc.typeThesis-
dc.contributor.department전기. 컴퓨터공학부-
dc.description.degreeMasteren
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