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1f noise modeling including oxide trap distribution
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 박영준 | - |
dc.contributor.author | 이종환 | - |
dc.date.accessioned | 2010-02-09T05:46:32Z | - |
dc.date.available | 2010-02-09T05:46:32Z | - |
dc.date.copyright | 2006. | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047701 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/53038 | - |
dc.description | Thesis(master`s)--서울대학교 대학원 :전기. 컴퓨터공학부,2006. | en |
dc.format.extent | 47 leaves | en |
dc.language.iso | en | en |
dc.publisher | 서울대학교 대학원 | en |
dc.subject | 잡음 | en |
dc.subject | 1 | en |
dc.subject | f noise | en |
dc.subject | noise | en |
dc.subject | impedance field method | en |
dc.subject | number fluctuation | en |
dc.subject | mobility fluctuation | en |
dc.subject | noise measurement | en |
dc.subject | noise simulation | en |
dc.subject | MOSFET | en |
dc.title | 1f noise modeling including oxide trap distribution | en |
dc.type | Thesis | - |
dc.contributor.department | 전기. 컴퓨터공학부 | - |
dc.description.degree | Master | en |
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