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Secondary electron emission properties of III-nitride/ZnO coaxial heterostructures under ion and X-ray bombardment

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Authors
Cholewa, M.; Moser, H.O.; Huang, Lie; Lau, Shu Ping; Yoo, Jinkyoung; An, Sung Jin; Yi, Gyu-Chul; Xingyu, Gao; Wee, A.T.S.; Bettiol, A.; Watt, F.; Fischer, B.
Issue Date
2006-11-14
Publisher
Elsevier
Citation
Nucl. Instr. and Meth. in Phys. Res. B 254 (2007) 55
Keywords
Nanomaterials; Secondary electron production; Radiation detectors
Abstract
The secondary electron emission (SEE) yield of heterostructures of zinc oxide (ZnO) nanoneedles coaxially coated with aluminum nitride (AIN) or gallium nitride (GaN) has been studied using ion and X-ray beams. This paper describes experiments performed with ions (2 MeV protons and 3.6 MeV/nucleon carbon beams) and photons (synchrotron radiation at approximate to 1 keV). The SEE yield of the heterostructures is enhanced significantly by the intrinsic nanostructure of the ZnO nanoneedle templates as compared to the AIN and GaN thin films on silicon (Si) substrates [T.J. Vink, R.G.F.A. Verbeek, V. Elsbergen, P.K. Bachmann, Appl. Phys. Lett. 83 (2003) 2285]. One of the mechanisms responsible for SEE yield enhancement can be attributed to the larger area of the nanostructured surface.
ISSN
0168-583X
Language
English
URI
http://hdl.handle.net/10371/5466
DOI
https://doi.org/10.1016/j.nimb.2006.09.014
https://doi.org/10.1016/j.nimb.2006.09.014
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College of Natural Sciences (자연과학대학)Dept. of Physics and Astronomy (물리·천문학부)Physics (물리학전공)Journal Papers (저널논문_물리학전공)
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