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The use of secondary ion mass spectrometry to investigate copolymer enhanced adhesion between immiscible polymers

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Authors
Deline, V. R.; Brown, H. R.; Char, K.
Issue Date
1991-05
Publisher
American Vacuum Society
Citation
J. Vac. Sci. Technol. A 9, 1283 (1991)
Abstract
The interfacial adhesion between immiscible polymers (homopolymers) is usually weak, but it can be strengthened with the addition of a diblock copolymer where one block is miscible with one homopolymer and the other block is miscible with the other homopolymer. A diblock copolymer consists of one polymer chain chemically linked at one end to another polymer chain. Secondary ion mass spectrometry (SIMS) is used to measure the copolymer organization at the joining interface, to measure the extent of intermixing between the copolymer blocks and the adjoining homopolymers and to determine the location of the copolymer blocks after the joint is fractured. The SIMS results provide unique and valuable information on the function of the copolymer to enhance the adhesion between the immiscible homopolymers.
ISSN
0734-2101
Language
English
URI
http://hdl.handle.net/10371/5879
DOI
https://doi.org/10.1116/1.577613
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Chemical and Biological Engineering (화학생물공학부)Journal Papers (저널논문_화학생물공학부)
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