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Estimation of the Thickness Dependence of the Glass Transition Temperature in Various Thin Polymer Films
Cited 158 time in
Web of Science
Cited 164 time in Scopus
- Authors
- Issue Date
- 2000
- Publisher
- American Chemical Society
- Citation
- Langmuir 2000, 16, 4064-4067
- Abstract
- The glass transition temperature (Tg) in the thin poly(R-methyl styrene) and polysufone films that are
coated on the surface of a Si wafer is investigated in this paper. A novel equation was suggested to estimate
the thickness dependence of Tg in thin films. Ellipsometry has been used to measure Tg of various thin
films as functions of sample thickness, molecular weight, and kind of polymer. One adjustable parameter
in the equation, i.e., ê, was obtained from fitting this function with the experimentally measured Tg. The
magnitude of the fitted parameter ê showed discrepancies between the polymer types but similarity between
the molecular weights. This parameter ê corresponded to the statistical segment length of the polymer.
All the measured Tg data of the investigated polymers were superimposed in one curve by normalizing
the thickness and the measured Tg with the parameter ê and bulk Tg, respectively. The origin of Tg
depression phenomena in thin films was closely correlated with its segmental length and not with whole
chain size.
- ISSN
- 0743-7463
- Language
- English
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