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Issue Date	Title / Author(s) / Citation	File
1998-05	Phase boundary between ripple and hut in the initial roughening stage in heteroepitaxy Suh, K. Y.; Lee, Hong H. J. Chem. Phys. 83, 4991 (1998)	view file
1998-08	Effect of processing conditions on the growth of strained Si1-xGex layers on Si Suh, K. Y.; Lee, Hong H. J. Appl. Phys. 84, 2361 (1998)	view file
1999-01	Two-step kinetics of As/P exchange reaction Suh, K. Y.; Lee, Hong H.; Yoon, E J. Appl. Phys. 85, 233 (1999)	view file
2023-02	Origin of extra diffraction spots for high crystalline alpha-Ga2O3 Lee, Yong-Hee; Yang, Duyoung; Gil, Byeongjun; Sheen, Mi-Hyang; Yoon, Euijoon; Park, Yongjo; Jang, Ho-Won; Yoon, Sangmoon; Kim, Miyoung; Kim, Young-Woon AIP Advances, Vol.13 No.2, p. 025148	DOI