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Detection of Process Faults by Multiscale-Based Methods : 다중척도 방법을 이용한 공정의 결함 감지
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- Authors
- Advisor
- 오희석
- Issue Date
- 2010
- Publisher
- 서울대학교 대학원
- Keywords
- 결함감지 ; classification ; 다중척도 구조 ; process faults ; 웨이블릿 ; support vector machines ; 오분류율 ; unbalanced Haar ; wavelets
- Description
- Thesis(masters) --서울대학교 대학원 :통계학과,2010.2.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000033061
https://hdl.handle.net/10371/65319
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