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Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

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Authors
Kim, Hyo Jung; Lee, Hyun Hwi; Kim, Jang-Joo
Issue Date
2009-06-30
Publisher
Wiley-Blackwell
Citation
Macromol. Rapid Commun. 2009, 30, 1269
Keywords
interfacesIPNmorphologyP3HTwide-angle X-ray scattering (WAXS)
ISSN
1022-1336 (print)
1521-3927 (online)
http://dx.doi.org/10.1002/marc.200900224
Language
English
URI
http://hdl.handle.net/10371/6933
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Material Science and Engineering (재료공학부) Journal Papers (저널논문_재료공학부)
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