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Blister Test를 이용한 폴리이미드 신경 전극의 안정성 평가 : Application of the Blister Test to Assess Reliability of Polymide Based Microelectrode Arrays
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- Authors
- Issue Date
- 2007-11-09
- Citation
- 제36회 대한의용생체공학회 추계학술대회, 고려대학교, 2007년 11월 9일
- Language
- Korean
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