SHERP

Blister Test를 이용한 폴리이미드 신경 전극의 안정성 평가
Application of the Blister Test to Assess Reliability of Polymide Based Microelectrode Arrays

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Authors
이승우; 김의태; 김성준
Issue Date
2007-11-09
Publisher
대한의용생체공학회 = The Korean Society of Medical & Biological Engineering
Citation
제36회 대한의용생체공학회 추계학술대회, 고려대학교, 2007년 11월 9일
Language
Korean
URI
http://hdl.handle.net/10371/7913
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Others_전기·정보공학부
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