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Blister Test를 이용한 폴리이미드 신경 전극의 안정성 평가 : Application of the Blister Test to Assess Reliability of Polymide Based Microelectrode Arrays
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이승우 | - |
| dc.contributor.author | 김의태 | - |
| dc.contributor.author | 김성준 | - |
| dc.date.accessioned | 2009-08-27T02:49:40Z | - |
| dc.date.available | 2009-08-27T02:49:40Z | - |
| dc.date.issued | 2007-11-09 | - |
| dc.identifier.citation | 제36회 대한의용생체공학회 추계학술대회, 고려대학교, 2007년 11월 9일 | en |
| dc.identifier.uri | https://hdl.handle.net/10371/7913 | - |
| dc.description.sponsorship | This study was supported by Korea Science and Engineering Foundation (KOSEF) through Nano Bioelectronics and Systems Research Center (NBS-ERC) in Seoul National University, and by a grant of the Korea Health 21 R&D Project (A050251),Ministry of Health & Welfare, Republic of Korea. | en |
| dc.language.iso | ko | en |
| dc.publisher | 대한의용생체공학회 = The Korean Society of Medical & Biological Engineering | en |
| dc.title | Blister Test를 이용한 폴리이미드 신경 전극의 안정성 평가 | en |
| dc.title.alternative | Application of the Blister Test to Assess Reliability of Polymide Based Microelectrode Arrays | en |
| dc.type | Conference Paper | en |
| dc.contributor.AlternativeAuthor | Lee, S. W. | - |
| dc.contributor.AlternativeAuthor | Kim, E. T. | - |
| dc.contributor.AlternativeAuthor | Kim, Sung June | - |
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