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Showing results 1 to 8 of 8

Issue DateTitle / Author(s) / CitationFileAltmetrics
2020-05

Jeong, Yonghwan; Yi, Kyongsu

IEEE Access, Vol.8, pp.106183-106197

DOI
2019-10

Hong, Seungki; Lee, Sangkyu; Kim, Dae-Hyeong

Proceedings of the IEEE, Vol.107 No.10, pp.2185-2197

DOI
2012-11DOI
2012-06view fileDOI
2008

Ko, Sungrok; Jang, Jyongsik

Ultramicroscopy 108 (2008) 1328-1333

DOI
2006-05

Yoon, Kyung Hun; Shuler, Michael L.; Kim, Sung June

Opt. Express 14, 4842-4849 (2006)

DOI
2005-03

Byun, Kyung Min; Kim, Sung June; Kim, Donghyun

Opt. Express 13, 3737-3742 (2005)

DOI
2005

Jang, Jyongsik; Jang, Mincheol; Yoon, Hyunseok

Adv. Mater. 2005, 17, 1616

DOI
1