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A Micromachined Silicon Depth Probe for Multichannel Neural Recording

DC Field Value Language
dc.contributor.authorYoon, Tae Hwan-
dc.contributor.authorHwang, Eun Jung-
dc.contributor.authorShin, Dong Yong-
dc.contributor.authorPark, Se Ik-
dc.contributor.authorOh, Seung Jae-
dc.contributor.authorJung, Sung Cherl-
dc.contributor.authorShin, Hyung Cheul-
dc.contributor.authorKim, Sung June-
dc.date.accessioned2009-09-07T23:29:37Z-
dc.date.available2009-09-07T23:29:37Z-
dc.date.issued2000-08-
dc.identifier.citationIEEE Trans. Biomed. Eng., vol. 47, pp. 1082-1087, Aug. 2000en
dc.identifier.issn0018-9294-
dc.identifier.urihttps://hdl.handle.net/10371/8867-
dc.description.abstractAprocess of making a new type of silicon depth-probe
microelectrode array is described using a combination of plasma
and wet etch. The plasma etch, which is done using a low temperature
oxide (LTO) mask, enables probe thickness to be controlled
over a range from 5 to 90 . Bending tests show that the probes
mechanical strength depends largely on shank thickness. More
force can be applied to thicker shanks while thinner shanks are
more flexible. One can then choose a thickness and corresponding
mechanical strength using the process developed. The entire
probe shaping process is performed only at low temperature,
and thus is consistent with the standard CMOS fabrication.
Using the probe in recording from rats somatosensory cortex,
we obtained four channel simultaneous recordings which showed
clear independence among channels with a signal-to-noise ratio
performance comparable with that obtained using other devices.
en
dc.description.sponsorshipThis paper was
supported by the Nano Bioelectronics & System Center, Basic Research program
of Korea Science and Engineering Foundation (KOSEF) under Grant 971-
0913-076-2, by the Korea Research Foundation (NDRF) under Grant 1996-012-
E0529, by Ministry Health andWelfare, Korea under Grant HMP-98-E-1-0006,
by the Korea Electronic Technology Institute (KETI) MEMS, and by the Research
Products Sharing Program of Inter-university Semiconductor Research
Center (ISRC) at Seoul National University.
en
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.subjectMechanical stress testen
dc.subjectmultichannel simultaneous recordingen
dc.subjectneural probesen
dc.subjectplasma etchen
dc.subjectsilicon microelectrode arrayen
dc.titleA Micromachined Silicon Depth Probe for Multichannel Neural Recordingen
dc.typeArticleen
dc.contributor.AlternativeAuthor윤태환-
dc.contributor.AlternativeAuthor황은정-
dc.contributor.AlternativeAuthor신동용-
dc.contributor.AlternativeAuthor박세익-
dc.contributor.AlternativeAuthor오승재-
dc.contributor.AlternativeAuthor정성철-
dc.contributor.AlternativeAuthor신형철-
dc.contributor.AlternativeAuthor김성준-
dc.identifier.doi10.1109/10.855936-
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