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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
---|---|---|---|
2001 | Journal of Electronic Materials, 30, L32(2001) | DOI | |
2002-05 | Journal of Electronic Materials, 31, 868(2002) | view fileDOI | |
2002-11 | Jpn. J. Appl. Phys. 41 (2002) L1206 | link | |
2004-01 | Spectroscopic ellipsometric study of ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrate J. Korean Phys. Soc. 44, 129 (2004) | view filelink | |
2006 | Opt. Rev. 13 (2006) 218 | DOI | |
2006-10 | J. Korean Phys. Soc. 49, 1635 (2006) | view filelink | |
2011-02 | link | ||
2017-02 | view file | ||
2019-08 | view filelink |
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