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Issue DateTitle / Author(s) / CitationFileAltmetrics
2005-03

Baac, Hyoungwon; Jun, Sang Beom; Turner, James N.; Shain, William; Smith, Karen L.; Shuler, Michael L.; Kim, Sung June

The 2nd International IEEE EMBS Conference on Neural Engineering Conference Proceeing, pp. 332-335, Arlington, Virginia, March 16-19, 2005

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1