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Issue DateTitle / Author(s) / CitationFileAltmetrics
2022-09
Influence of Channel Hole Remaining Ratio on Hemi-Cylindrical Vertical NAND Flash Memory

Chang, Jin Ho; Uhm, Ji Ho; Kwon, Hyug Su; Kwon, Eunmee; Choi, Woo Young

IEEE Electron Device Letters, Vol.43 No.9, pp.1432-1435

DOI
1