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Issue DateTitle / Author(s) / CitationFileAltmetrics
2014-12

Yang, Min; Chon, Min-Woo; Kim, Joo-Hyun; Lee, Seung-Hyun; Jo, Jeongdai; Yeo, Junyeob; Ko, Seung Hwan; Choa, Sung-Hoon

Microelectronics and Reliability, Vol.54 No.12, pp.2871-2880

DOI
1