2017-07 | Jeong, Seongmin; Cho, Hyunmin; Han, Seonggeun; Won, Phillip; Lee, Habeom; Hong, Sukjoon; Yeo, Junyeob; Kwon, Jinhyeong; Ko, Seung Hwan Nano Letters, Vol.17 No.7, pp.4339-4346 | DOI | |
2018-09 | | DOI | |
2019-05 | Lee, Woorim; Kihm, Kenneth David; Lee, Woomin; Won, Phillip; Han, Seonggeun; Lim, Gyumin; Pyun, Kyung Rok; Ko, Seung Hwan International Journal of Heat and Mass Transfer, Vol.134, pp.547-553 | DOI | |
2019-09 | Won, Philip; Park, Jung Jae; Lee, Taemin; Ha, Inho; Han, Seonggeun; Choi, Mansoo; Lee, Jinhwan; Hong, Sukjoon; Cho, Kyu-Jin; Ko, Seung Hwan Nano Letters, Vol.19 No.9, pp.6087-6096 | DOI | |
2020-09 | Lee, Jinwoo; Sul, Heayoun; Jung, Yeongju; Kim, Hyeonseok; Han, Seonggeun; Choi, Joonhwa; Shin, Jaeho; Kim, Dongkwan; Jung, Jinwook; Hong, Sukjoon; Ko, Seung Hwan Advanced Functional Materials, Vol.30 No.36, p. 2003328 | DOI | |
2021-10 | Ha, Inho; Kim, Minwoo; Kim, Kyun Kyu; Hong, Sukjoon; Cho, Hyunmin; Kwon, Jinhyeong; Han, Seonggeun; Yoon, Yeosang; Won, Phillip; Ko, Seung Hwan Advanced Science, Vol.8 No.20, p. 2102536 | DOI | |
2022-01 | Han, Seonggeun; Kim, Jaewon; Lee, Youngseok; Bang, Junhyuk; Kim, Cheol Gyun; Choi, Junhwa; Min, Jinki; Ha, Inho; Yoon, Yeosang; Yun, Cheol-Heui; Cruz, Mutya; Wiley, Benjamin J.; Ko, Seung Hwan Nano Letters, Vol.22 No.1, pp.524-532 | DOI | |
2022-06 | Won, Daeyeon; Kim, Jin; Choi, Joonhwa; Kim, HyeongJun; Han, Seonggeun; Ha, Inho; Bang, Junhyuk; Kim, Kyun Kyu; Lee, Youngseok; Kim, Taek-Soo; Park, Jae-Hak; Kim, C-Yoon; Ko, Seung Hwan Science Advances, Vol.8 No.23, p. eabo3209 | DOI | |
2023-01 | Yoon, Yeosang; Park, Huijae; Lee, Jinwoo; Choi, Joonhwa; Jung, Yeongju; Han, Seonggeun; Ha, Inho; Ko, Seung Hwan Chemical Engineering Journal, Vol.451, p. 138794 | DOI | |
2023-01 | Kim, Kyun Kyu; Kim, Min; Pyun, Kyungrok; Kim, Jin; Min, Jinki; Koh, Seunghun; Root, Samuel E.; Kim, Jaewon; Nguyen, Bao-Nguyen T.; Nishio, Yuya; Han, Seonggeun; Choi, Joonhwa; Kim, C-Yoon; Tok, Jeffrey B. -H.; Jo, Sungho; Ko, Seung Hwan; Bao, Zhenan Nature Electronics, Vol.6 No.1, pp.64-75 | DOI | |