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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2016-06	Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing Kang, Pilsung; Kim, Dongil; Cho, Sungzoon Expert Systems with Applications, Vol.51, pp.85-106	DOI
2023	Generating synthetic data with Inferential Wasserstein Generative Adversarial Network 김승종	view file link