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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2008	상온에서 ICP-CVD를 이용하여 제작된 미세결정 실리콘 TFT에 관한 연구 김선재	link
2008-03	Reduction of proximity effect in electron beam lithography by deposition of a thin film of silicon dioxide Seo, Chang-Ho; Suh, Kahp-Yang Korean J. Chem. Eng., 25, 373 (2008)	DOI