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Issue DateTitle / Author(s) / CitationFileAltmetrics
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2020

Oh, Jongsu; Jung, Kyung-Mo; Jung, Eun Kyo; Lee, Jungwoo; Lee, Soo-Yeon; Park, Keechan; Jeon, Jae-Hong; Kim, Yong-Sang

IEEE Journal of the Electron Devices Society, Vol.8 No.1, pp.67-73

DOI
2021-02view filelink
1