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In-situ analysis of In(Ga)As layer growth by spectral reflectance : Spectral reflectance를 이용한 In(Ga)As층 성장의 실시간 분석
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 윤의준 | - |
dc.contributor.author | 안응진 | - |
dc.date.accessioned | 2009-11-18T22:47:51Z | - |
dc.date.available | 2009-11-18T22:47:51Z | - |
dc.date.copyright | 2007. | - |
dc.date.issued | 2007 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000042914 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/13584 | - |
dc.description | 학위논문(박사) --서울대학교 대학원 :재료공학부,2007. | eng |
dc.format.extent | ix, 111 장 | eng |
dc.language.iso | en | eng |
dc.publisher | 서울대학교 대학원 | eng |
dc.subject | 유기금속 화학기상 증착법 (MOCVD) | eng |
dc.subject | Metalorganic chemical vapor deposition (MOCVD) | eng |
dc.subject | spectral reflectance (SR) | eng |
dc.subject | spectral reflectance (SR) | eng |
dc.subject | 실시간모니터링 | eng |
dc.subject | in-situ monitoring | eng |
dc.subject | InAs | eng |
dc.subject | epitaxial growth | eng |
dc.subject | InGaAs | eng |
dc.subject | InAs | eng |
dc.subject | GaAs | eng |
dc.subject | InGaAs | eng |
dc.subject | InP | eng |
dc.subject | GaAs | eng |
dc.subject | ZnO | eng |
dc.subject | InP | eng |
dc.subject | multibeam optical stress sensor (MOSS) | eng |
dc.subject | ZnO | eng |
dc.subject | 자발형성 양자점 (SAQD) | eng |
dc.subject | surface reconstruction | eng |
dc.subject | InP | eng |
dc.subject | surface reaction | eng |
dc.subject | InGaAs | eng |
dc.subject | multibeam optical stress sensor (MOSS) | eng |
dc.subject | GaAs | eng |
dc.subject | self-assembled quantum dots (SAQD) | eng |
dc.subject | InP | eng |
dc.subject | photoluminescence (PL) | eng |
dc.subject | ZnO | eng |
dc.subject | atomic force microscopy (AFM) | eng |
dc.subject | 표면 reconstruction | eng |
dc.subject | reflectance anisotropy spectroscopy (RAS) | eng |
dc.subject | 표면 반응 | eng |
dc.subject | surface photoabsorption (SPA) | eng |
dc.subject | 다중빔광학 응력측정기 (MOSS) | eng |
dc.subject | 원자전자현미경 (AFM) | eng |
dc.subject | reflectance anisotropy spectroscopy (RAS) | eng |
dc.subject | surface photoabsorption (SPA) | eng |
dc.title | In-situ analysis of In(Ga)As layer growth by spectral reflectance | eng |
dc.title.alternative | Spectral reflectance를 이용한 In(Ga)As층 성장의 실시간 분석 | eng |
dc.type | Thesis | - |
dc.contributor.department | 재료공학부 | - |
dc.description.degree | Doctor | eng |
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