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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2019-08	Supervised Deep Learning-based Anomaly Detection Models and Their Applications in Finance, Manufacturing, and Media 김은지	view file link
2021-11	Adaptive fault detection framework for recipe transition in semiconductor manufacturing Shim, Jaewoong; Cho, Sungzoon; Kum, Euiseok; Jeong, Suho Computers and Industrial Engineering, Vol.161, p. 107632	DOI