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Improved gating device of time-of-flight ion mass analyzer for ion sources

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Authors

Choe, Kyumin; Kim, DongHwan; Chung, Kyoung-Jae; Hwang, Yong Seok

Issue Date
2019-03
Publisher
American Institute of Physics
Citation
Review of Scientific Instruments, Vol.90 No.3, p. 033305
Abstract
A gating device is a critical component in a time-of-flight (TOF) ion mass analyzer for identifying ion species extracted from ion sources according to their mass-to-charge ratio. It consists of several concentric ring electrodes to deflect as many ions as possible within a very short gate time, thus increasing the ion current collected in a Faraday cup. In this study, we further improve the ion collection efficiency of the gating device by minimizing potential distortion along the paths of ions, by modifying the structure of gate electrodes and applying a bipolar gate pulse on them. Using the improved gating device, we find that the ion beam current increased by nearly 50% compared to the conventional one without changing the noise level. The improved TOF system is well applied to identify the spectrum of ion species extracted from a cold cathode Penning ion source, depending on the operating conditions. Published under license by AIP Publishing.
ISSN
0034-6748
Language
ENG
URI
https://hdl.handle.net/10371/163601
DOI
https://doi.org/10.1063/1.5088576
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