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Dynamic analysis of the extended space charge layer using chronopotentiometric measurements

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dc.contributor.authorCho, Inhee-
dc.contributor.authorLee, Hyomin-
dc.contributor.authorKim, Sung Jae-
dc.date.accessioned2020-07-01T00:49:35Z-
dc.date.available2020-07-01T09:51:48Z-
dc.date.issued2020-06-05-
dc.identifier.citationMicro and Nano Systems Letters. 2020 Jun 05;8(1):10ko_KR
dc.identifier.issn2213-9621-
dc.identifier.urihttps://doi.org/10.1186/s40486-020-00112-1-
dc.identifier.urihttps://hdl.handle.net/10371/168551-
dc.description.abstractIn this paper, we experimentally verified the length (LESC) and the concentration (cESC) of the extended space charge (ESC) layer in front of the electrical double layer (EDL) using the chronopotentiometric measurement and the equivalent circuit model analysis. From the experimentation, the coupled-response of the EDL and the ESC layer was discriminated from the contribution of electro-osmotic flow (EOF). In addition, we derived the potential differences across the ESC (VESC) layer using the circuit model of the ICP layer under rigorous consideration of ESC and EDL. As a result, we obtained that VESC was linearly proportional to the square of the applied current (iapplied). Hence, LESC and cESC were quantitatively provided, where LESC is linear to the iapplied and cESC is constant regardless of iapplied. Thus, this experimentation could not only clarify an essential ICP theory but also guide in ESC-based applications.ko_KR
dc.description.sponsorshipThis work is supported by the Basic Research Laboratory Project (NRF2018R1A4A1022513) and Mid-Career Project (NRF-2020R1A2C3006162) by the Ministry of Science and ICT. I. Cho was supported by the National Research Foundation of Korea (NRF) grant funded by the Ministry of Science and ICT (NRF-2020R1F1A1072960).ko_KR
dc.language.isoenko_KR
dc.publisherSpringer Openko_KR
dc.subjectIon concentration polarization-
dc.subjectChronopotentiometric measurement-
dc.subjectExtended space charge layer-
dc.titleDynamic analysis of the extended space charge layer using chronopotentiometric measurementsko_KR
dc.typeArticleko_KR
dc.contributor.AlternativeAuthor조인희-
dc.contributor.AlternativeAuthor이효민-
dc.contributor.AlternativeAuthor김성재-
dc.citation.journaltitleMicro and Nano Systems Lettersko_KR
dc.language.rfc3066en-
dc.rights.holderThe Author(s)-
dc.date.updated2020-06-16T09:26:42Z-
dc.citation.number1ko_KR
dc.citation.startpage10ko_KR
dc.citation.volume8ko_KR
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