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Controlling the ripple density and heights: A new way to improve the electrical performance of CVD-grown graphene
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Won-Hwa | - |
dc.contributor.author | Jo, Insu | - |
dc.contributor.author | Hong, Byung Hee | - |
dc.contributor.author | Cheong, Hyeonsik | - |
dc.date.accessioned | 2021-01-31T08:32:47Z | - |
dc.date.available | 2021-01-31T08:32:47Z | - |
dc.date.created | 2018-08-10 | - |
dc.date.created | 2018-08-10 | - |
dc.date.created | 2018-08-10 | - |
dc.date.issued | 2016-04 | - |
dc.identifier.citation | Nanoscale, Vol.8 No.18, pp.9822-9827 | - |
dc.identifier.issn | 2040-3364 | - |
dc.identifier.other | 42977 | - |
dc.identifier.uri | https://hdl.handle.net/10371/172223 | - |
dc.description.abstract | We report a new way to enhance the electrical performances of large area CVD-grown graphene through controlling the ripple density and heights after transfer onto SiO2/Si substrates by employing different cooling rates during fabrication. We find that graphene films prepared with a high cooling rate have reduced ripple density and heights and improved electrical characteristics such as higher electron/hole mobilities as well as reduced sheet resistance. The corresponding Raman analysis also shows a significant decrease of the defects when a higher cooling rate is employed. We suggest a model that explains the improved morphology of the graphene film obtained with higher cooling rates. From these points of view, we can suggest a new pathway toward a relatively lower density and heights of ripples in order to reduce the flexural phonon-electron scattering effect, leading to higher lateral carrier mobilities. | - |
dc.language | 영어 | - |
dc.publisher | Royal Society of Chemistry | - |
dc.title | Controlling the ripple density and heights: A new way to improve the electrical performance of CVD-grown graphene | - |
dc.type | Article | - |
dc.contributor.AlternativeAuthor | 홍병희 | - |
dc.identifier.doi | 10.1039/c6nr00706f | - |
dc.citation.journaltitle | Nanoscale | - |
dc.identifier.wosid | 000375799900044 | - |
dc.identifier.scopusid | 2-s2.0-84971657003 | - |
dc.citation.endpage | 9827 | - |
dc.citation.number | 18 | - |
dc.citation.startpage | 9822 | - |
dc.citation.volume | 8 | - |
dc.identifier.sci | 000375799900044 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Hong, Byung Hee | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.subject.keywordPlus | CHEMICAL-VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.subject.keywordPlus | SCATTERING | - |
dc.subject.keywordPlus | MONOLAYER | - |
dc.subject.keywordPlus | FILMS | - |
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