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Switching Voltage Analysis of Nanoelectromechanical Memory Switches for Monolithic 3-D CMOS-NEM Hybrid Reconfigurable Logic Circuits

Cited 11 time in Web of Science Cited 9 time in Scopus
Authors

Lee, Ho Moon; Jo, Hyun Chan; Kwon, Hyug Su; Choi, Woo Young

Issue Date
2018-09
Publisher
Institute of Electrical and Electronics Engineers
Citation
IEEE Transactions on Electron Devices, Vol.65 No.9, pp.3780-3785
Abstract
The accurate calculation of switching voltage (V-s) is necessary for the reliable and low-power operation of monolithic 3-D (M3D) CMOS-nanoelectromechanical (NEM) hybrid reconfigurable logic circuits because V-s corresponds to the operating voltage (V-dd) of NEM memory switches. In this paper, based on the Euler-Bernoulli equation, the physics-based analytical model is proposed to determine V-s. The accuracy of the proposed model is verified by both the finite-element analysis and experimental results. Our proposed model shows >3% error compared with experimental data. Also, the design guidelines of NEM memory switches are presented in terms of minimum V-s (V-s_(m)) and device dimensions.
ISSN
0018-9383
URI
https://hdl.handle.net/10371/186764
DOI
https://doi.org/10.1109/TED.2018.2858775
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