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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2006-12	Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia Yoon, Uicheul; Lee, Jong-Min; Im, Kiho; Shin, Yong-Wook; Cho, Baek Hwan; Kim, In Young; Kwon, Jun Soo; Kim, Sun I Neuroimage. 2007 Feb 15;34(4):1405-15. Epub 2006 Dec 26.	view file link