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Texton 기법을 응용한 Semi-conductor wafer SEM 영상의 불량검출

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Authors

류휘정

Advisor
유석인
Issue Date
2009
Publisher
서울대학교 대학원
Keywords
웨이퍼WaferSEMSEM불량 검출detect detectionTextonTextonPCAPCA이미지 코딩Image Coding
Description
학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부,2009.8.
Language
Korean
URI
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000038757

https://hdl.handle.net/10371/44663
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