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서브픽셀 알고리즘을 적용한 TFT-LCD 셀 공정에서의 기준 정렬키 측정 시스템 개발 : Development of alignment-key measurement system in TFT-LCD CELL-processing using subpixel algorithm
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박희재 | - |
| dc.contributor.author | 하상모 | - |
| dc.date.accessioned | 2010-02-01T11:03:01Z | - |
| dc.date.available | 2010-02-01T11:03:01Z | - |
| dc.date.copyright | 2007. | - |
| dc.date.issued | 2007 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000045734 | kog |
| dc.identifier.uri | https://hdl.handle.net/10371/48187 | - |
| dc.description | 학위논문(석사)--서울대학교 대학원 :기계항공공학부,2007. | ko |
| dc.format.extent | vii, 39 장 | ko |
| dc.language.iso | ko | ko |
| dc.publisher | 서울대학교 대학원 | ko |
| dc.subject | TFT-LCD | ko |
| dc.subject | TFT-LCD | ko |
| dc.subject | CD(Critical Dimension) | ko |
| dc.subject | Subpixel Algorithm | ko |
| dc.subject | 자동초점 | ko |
| dc.subject | Auto-Focusing | ko |
| dc.subject | Sub-pixel Edge Detection | ko |
| dc.subject | Alignment-Key | ko |
| dc.title | 서브픽셀 알고리즘을 적용한 TFT-LCD 셀 공정에서의 기준 정렬키 측정 시스템 개발 | ko |
| dc.title.alternative | Development of alignment-key measurement system in TFT-LCD CELL-processing using subpixel algorithm | ko |
| dc.type | Thesis | - |
| dc.contributor.department | 기계항공공학부 | - |
| dc.description.degree | Master | ko |
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