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Memory subsystem parameter 자동 측정도구

DC Field Value Language
dc.contributor.advisor이재진-
dc.contributor.author하태준-
dc.date.accessioned2010-02-02T07:10:40Z-
dc.date.available2010-02-02T07:10:40Z-
dc.date.copyright2008.-
dc.date.issued2008-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041221kog
dc.identifier.urihttps://hdl.handle.net/10371/48380-
dc.description학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부,2008.2ko
dc.format.extent26 장ko
dc.language.isokoko
dc.publisher서울대학교 대학원ko
dc.subject임베디드 시스템ko
dc.subjectembedded systemko
dc.subject메모리 뱅크ko
dc.subjectmemory bankko
dc.subject하드웨어 파라미터 측정 프로그램ko
dc.subjecthardware parameter detectionko
dc.titleMemory subsystem parameter 자동 측정도구ko
dc.typeThesis-
dc.contributor.department전기. 컴퓨터공학부-
dc.description.degreeMasterko
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