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Thickness dependence of the melting temperature in thin polymer films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jang, Jyongsik | - |
| dc.contributor.author | Kim, Jae Hyun | - |
| dc.contributor.author | Zin, Wang-Cheol | - |
| dc.date.accessioned | 2010-02-03T09:28:41Z | - |
| dc.date.available | 2010-02-03T09:28:41Z | - |
| dc.date.issued | 2001 | - |
| dc.identifier.citation | Macromol. Rapid Commun. 2001, 22, 386 | en |
| dc.identifier.issn | 1022-1336 | - |
| dc.identifier.uri | http://www3.interscience.wiley.com/journal/78505167/abstract | - |
| dc.identifier.uri | https://hdl.handle.net/10371/49111 | - |
| dc.description.abstract | The melting temperature (Tm) of thin
poly[ethylene-co-(vinyl acetate)] films coated on a silicon wafer was investigated. Ellipsometry was used to measure the Tm which was found to decrease dramatically when the thickness of the film is less than 300 A° . The relationship between the lamellar thickness and the Tm was thought to be responsible this thickness dependence of the Tm in thin polymer films. | en |
| dc.description.sponsorship | This research has been supported by the
Korea Science and Engineering Foundation through the Hyperstructured Organic Materials Research Center and the authors gratefully acknowledge the support received from this organization. | en |
| dc.language.iso | en | en |
| dc.publisher | Wiley-Blackwell | en |
| dc.title | Thickness dependence of the melting temperature in thin polymer films | en |
| dc.type | Article | en |
| dc.contributor.AlternativeAuthor | 장정식 | - |
| dc.contributor.AlternativeAuthor | 김재현 | - |
| dc.contributor.AlternativeAuthor | 진왕철 | - |
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