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신경망을 적용한 공통 원인 고장 여향 벡터 평가에 관한 연구

DC Field Value Language
dc.contributor.advisor이은철-
dc.contributor.author유병태-
dc.date.accessioned2010-02-08T03:59:09Z-
dc.date.available2010-02-08T03:59:09Z-
dc.date.copyright1995.-
dc.date.issued1995-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000084483kog
dc.identifier.urihttps://hdl.handle.net/10371/51362-
dc.description학위논문(석사)--서울대학교 대학원 :원자핵공학과,1995.ko
dc.format.extentv, 36 장ko
dc.language.isokoko
dc.publisher서울대학교 대학원ko
dc.title신경망을 적용한 공통 원인 고장 여향 벡터 평가에 관한 연구ko
dc.typeThesis-
dc.contributor.department원자핵공학과-
dc.description.degreeMasterko
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Energy Systems Engineering (에너지시스템공학부)Nuclear Engineering (원자핵공학전공)Theses (Master's Degree_원자핵공학과)
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