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(A)Study on the ruggedness of the insulated gate bipolar transistor
絶緣 게이트형 바이폴라 트랜지스터의 强靭性에 관한 硏究

DC Field Value Language
dc.contributor.advisor한민구-
dc.contributor.author김수성-
dc.date.accessioned2010-02-08T04:48:10Z-
dc.date.available2010-02-08T04:48:10Z-
dc.date.copyright2005.-
dc.date.issued2005-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000050137eng
dc.identifier.urihttps://hdl.handle.net/10371/51534-
dc.descriptionThesis(doctoral)--서울대학교 대학원 :전기컴퓨터공학부,2005.en
dc.format.extentx, 138 leavesen
dc.language.isoenen
dc.publisher서울대학교 대학원en
dc.subjectUISen
dc.subjectunclamped inductive switchingen
dc.subject단락 회로 특성en
dc.subjectshort circuit capabilityen
dc.subjectIGBTen
dc.subjectIGBTen
dc.subject강인성en
dc.subjectruggednessen
dc.subject순방향 전압 강하en
dc.subjectsaturation voltageen
dc.subjectCSLen
dc.subjectcarrier stored layeren
dc.subject곡면 p-바디 접합en
dc.subjectcurved p-body junctionen
dc.subject트렌치en
dc.subjecttrenchen
dc.title(A)Study on the ruggedness of the insulated gate bipolar transistoren
dc.title.alternative絶緣 게이트형 바이폴라 트랜지스터의 强靭性에 관한 硏究en
dc.typeThesis-
dc.contributor.department전기컴퓨터공학부-
dc.description.degreeDoctoren
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Ph.D. / Sc.D._전기·정보공학부)
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