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Analytical thermal noise modeling of deep-submicron MOSFETs
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 신형철 | - |
dc.contributor.author | 김세영 | - |
dc.date.accessioned | 2010-02-09T14:54:33Z | - |
dc.date.available | 2010-02-09T14:54:33Z | - |
dc.date.copyright | 2005. | - |
dc.date.issued | 2005 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000052892 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/53488 | - |
dc.description | Thesis(master`s)--서울대학교 대학원 :전기공학부,2005. | en |
dc.format.extent | iii, 42 leaves | en |
dc.language.iso | en | en |
dc.publisher | 서울대학교 대학원 | en |
dc.subject | RF CMOS | en |
dc.subject | Drain thermal noise | en |
dc.subject | 열잡음 | en |
dc.subject | Induced gate noise | en |
dc.subject | RF 회로 설계 | en |
dc.subject | correlation coefficient | en |
dc.subject | 단채널 MOSFET | en |
dc.subject | RF MOSFET | en |
dc.subject | Impedance field method | en |
dc.title | Analytical thermal noise modeling of deep-submicron MOSFETs | en |
dc.type | Thesis | - |
dc.contributor.department | 전기공학부 | - |
dc.description.degree | Master | en |
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