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Heteroepitaxial Growth of High-Quality GaN Thin Films on Si Substrates Coated with Self-Assembled Sub-micrometer-sized

DC Field Value Language
dc.contributor.authorAn, Sung Jin-
dc.contributor.authorHong, Young Joon-
dc.contributor.authorYi, Gyu-Chul-
dc.contributor.authorKim, Yong-Jin-
dc.contributor.authorLee, Dong Kun-
dc.date.accessioned2009-07-14T05:31:51Z-
dc.date.available2009-07-14T05:31:51Z-
dc.date.issued2006-10-10-
dc.identifier.citationAdv. Mater. 2006, 18, 2833en
dc.identifier.issn0935-9648-
dc.identifier.urihttps://hdl.handle.net/10371/5461-
dc.description.abstractMonodisperse sub-micrometer-sized silica balls are employed as an intermediate layer for the heteroepitaxial growth of GaN thin films on Si(111) substrates (see figure). The structural and optical characteristics of the films are shown to be improved compared to conventional techniques, as the maskless overgrowth technique employed simplifies the growth process. This method could be exploited to grow other heteroepitaxial films on substrates with large lattice constants and thermal expansion coefficient mismatches.en
dc.description.sponsorshipThis work was supported financially by the Korea Science and Engineering Foundation (KOSEF) under the National Creative Research
Initiative Project of the Ministry of Science and Technology (MOST), Korea and partially by LG Siltron Co.
en
dc.language.isoenen
dc.publisherJohn Wiley & Sonsen
dc.subjectEpitaxial growthen
dc.subjectLithographyen
dc.subjectSelf assemblyen
dc.subjectSilicaen
dc.subjectThin filmsen
dc.titleHeteroepitaxial Growth of High-Quality GaN Thin Films on Si Substrates Coated with Self-Assembled Sub-micrometer-sizeden
dc.typeArticleen
dc.contributor.AlternativeAuthor안성진-
dc.contributor.AlternativeAuthor홍영준-
dc.contributor.AlternativeAuthor이규철-
dc.contributor.AlternativeAuthor김용진-
dc.contributor.AlternativeAuthor이동근-
dc.identifier.doi10.1002/adma.200601628-
dc.citation.journaltitleAdvanced Materials-
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