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Prediction of the misfit dislocation onset conditions during the cooling of the wafer in heteroepitaxy
heteroepitaxy에서 웨이퍼 냉각중에 불일치전위 발행조건의 예측

DC Field Value Language
dc.contributor.advisor이홍희-
dc.contributor.author최세진-
dc.date.accessioned2010-03-09T07:12:20Z-
dc.date.available2010-03-09T07:12:20Z-
dc.date.copyright1997.-
dc.date.issued1997-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000077123eng
dc.identifier.urihttps://hdl.handle.net/10371/58992-
dc.descriptionThesis (master`s)--서울대학교 대학원 :화학공학과,1997.en
dc.format.extentiii, 39 p.en
dc.language.isoenen
dc.publisher서울대학교 대학원en
dc.titlePrediction of the misfit dislocation onset conditions during the cooling of the wafer in heteroepitaxyen
dc.title.alternativeheteroepitaxy에서 웨이퍼 냉각중에 불일치전위 발행조건의 예측-
dc.typeThesis-
dc.contributor.department화학공학과-
dc.description.degreeMasteren
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Chemical and Biological Engineering (화학생물공학부)Theses (Master's Degree_화학생물공학부)
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