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Phase change behavior and electrical properties of SiO₂ doped Ge₂Sb₂Te? thin films for application in phase change random access memory

DC Field Value Language
dc.contributor.advisor김형준-
dc.contributor.author류승욱-
dc.date.accessioned2010-05-04T04:46:01Z-
dc.date.available2010-05-04T04:46:01Z-
dc.date.copyright2010-
dc.date.issued2010-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000032467eng
dc.identifier.urihttps://hdl.handle.net/10371/63865-
dc.descriptionThesis(doctors) --서울대학교 대학원 :재료공학부,2010.2.en
dc.format.extentxvii, 196 p.en
dc.language.isoenen
dc.publisher서울대학교 대학원en
dc.subjectGe₂Sb₂Te?en
dc.subjectPRAMen
dc.subjectChalcogenide materialsen
dc.subjectPhase Changeen
dc.subjectPCRAMen
dc.subjectGe₂Sb₂Te?en
dc.subjectCo-sputteringen
dc.subjectSiO₂en
dc.subjectSiO₂ doped Ge₂Sb₂Te?en
dc.subjectdopingen
dc.subjectThermal conductivityen
dc.subjectthermal conductivityen
dc.subjectThermal efficiencyen
dc.subjectthermal efficiencyen
dc.titlePhase change behavior and electrical properties of SiO₂ doped Ge₂Sb₂Te? thin films for application in phase change random access memoryen
dc.typeThesis-
dc.contributor.department재료공학부-
dc.description.degreeDoctoren
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