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Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing

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dc.contributor.authorKim, Hyo Jung-
dc.contributor.authorLee, Hyun Hwi-
dc.contributor.authorKim, Jang-Joo-
dc.date.accessioned2009-08-11T04:46:56Z-
dc.date.available2009-08-11T04:46:56Z-
dc.date.issued2009-06-30-
dc.identifier.citationMacromol. Rapid Commun. 2009, 30, 1269en
dc.identifier.issn1022-1336 (print)-
dc.identifier.issn1521-3927 (online)-
dc.identifier.issnhttp://dx.doi.org/10.1002/marc.200900224-
dc.identifier.urihttp://hdl.handle.net/10371/6933-
dc.language.isoen-
dc.publisherWiley-Blackwellen
dc.subjectinterfacesen
dc.subjectIPNen
dc.subjectmorphologyen
dc.subjectP3HTen
dc.subjectwide-angle X-ray scattering (WAXS)en
dc.titleReal Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealingen
dc.typeArticleen
dc.contributor.AlternativeAuthor김효정-
dc.contributor.AlternativeAuthor이현휘-
dc.contributor.AlternativeAuthor김장주-
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Material Science and Engineering (재료공학부) Journal Papers (저널논문_재료공학부)
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