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Real Time Investigation of the Interface between a P3HT:PCBM Layer and an Al Electrode during Thermal Annealing
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- Authors
- Issue Date
- 2009-06-30
- Publisher
- Wiley-Blackwell
- Citation
- Macromol. Rapid Commun. 2009, 30, 1269
- Keywords
- interfaces ; IPN ; morphology ; P3HT ; wide-angle X-ray scattering (WAXS)
- ISSN
- 1022-1336 (print)
1521-3927 (online)
http://dx.doi.org/10.1002/marc.200900224
- Language
- English
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