Browse

Thickness dependence of PL efficiency of organic thin films

DC Field Value Language
dc.contributor.authorJeong, Won-Ik-
dc.contributor.authorKim, Sei Yong-
dc.contributor.authorKim, Jang-Joo-
dc.contributor.authorKang, Jae Wook-
dc.date.accessioned2009-08-11T04:58:17Z-
dc.date.available2009-08-11T04:58:17Z-
dc.date.issued2009-01-
dc.identifier.citationChem. Phys. 355 (2009) 25en
dc.identifier.issn0301-0104-
dc.identifier.urihttps://hdl.handle.net/10371/6934-
dc.description.abstractThickness dependence of photoluminescence (PL) efficiency and spectral shape of phosphorescent organic thin films is investigated and theoretically analyzed. The PL efficiency increases with increasing thickness to reach the maximum 92% at around 50 nm. It reduces to 77% at the thickness of 130–140 nm and oscillates between the values upon further increment of thickness. The quenching of excitons at the surface of organic layer significantly reduces the PL efficiency when the film is very thin. If the film is thicker than the critical thickness for the waveguiding of emitted light, the waveguided power is absorbed during the propagation through the organic layer so that apparent PL efficiency is reduced by the amount. Microcavity effect formed by quartz/organic layer/air also affects the PL efficiency. The appropriate thickness to obtain the PL efficiency close to the intrinsic value of a film is just the critical thickness for waveguiding through the film.en
dc.description.sponsorshipThis work was supported by a grant from the MKE of Korea Government through the center for OLED.en
dc.language.isoen-
dc.publisherElsevieren
dc.subjectPL efficiency of thin filmsen
dc.subjectSurface quenchingen
dc.subjectWaveguideen
dc.subjectWeak microcavityen
dc.subjectThickness dependenceen
dc.titleThickness dependence of PL efficiency of organic thin filmsen
dc.typeArticleen
dc.contributor.AlternativeAuthor정원익-
dc.contributor.AlternativeAuthor김세용-
dc.contributor.AlternativeAuthor김장주-
dc.contributor.AlternativeAuthor강재욱-
dc.identifier.doi10.1016/j.chemphys.2008.10.035-
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Materials Science and Engineering (재료공학부)Journal Papers (저널논문_재료공학부)
Files in This Item:
There are no files associated with this item.
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse